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GPGPUs: How to Combine High Computational Power with High Reliability

L. Bautista Gomez, F. Cappello, L. Carro, N. DeBardeleben, B. Fang, S. Gurumurthi, S. Keckler, K. Pattabiraman, P. Rech, M. Sonza Reorda
Argonne National Laboratory, USA
Design Automation and Test in Europe Conference and Exhibition, 2014

@article{gomez2014gpgpus,

   title={GPGPUs: How to Combine High Computational Power with High Reliability},

   author={Gomez, L Bautista and Cappello, F and Carro, L and DeBardeleben, N and Fang, B and Gurumurthi, S and Keckler, S and Pattabiraman, K and Rech, P and Reorda, M Sonza},

   year={2014}

}

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GPGPUs are increasingly used in several domains, from gaming to different kinds of computationally intensive applications. In some cases, their reliability is becoming a serious issue and several research activities are focusing on its evaluation. This paper aims at overviewing some major results in the area. First, it shows and analyzes the results of some experiments aiming at assessing the GPGPU reliability in HPC datacenters. Secondly, it provides recent results about the reliability of some GPGPUs, derived from radiation experiments. Finally, it describes the characteristics of an advanced fault injection environment allowing one to effectively evaluate the resiliency of applications running on GPGPUs.
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