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Parallel Algorithm for Generation of Test Recommended Path using CUDA

Zhao Yu, Jae-Han Cho, Byoung-Woo Oh, Lee-Sub Lee
Department of Computer Engineering, Kumoh National Institute of Technology, Korea
International Journal of Engineering and Technology, Vol. 5, No.1, 2013

@article{yu2013parallel,

   title={Parallel Algorithm for Generation of Test Recommended Path using CUDA},

   author={Yu, Zhao and Cho, Jae-Han and Oh, Byoung-Woo and Lee, Lee-Sub},

   journal={International Journal of Engineering and Technology},

   volume={5},

   year={2013}

}

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Software testing of an application makes the user to find defect. The users, called testers, should test the various situations with test cases. In order to make test cases, many states and events have to be considered. It takes much time to create test cases with many states and events. Instead of using the common sequential algorithm, this paper proposes a parallel algorithm for generation of test cases. The proposed method achieves efficient performance using General-Purpose GPU (GPGPU), especially CUDA.
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